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Latest news

Mar 13, 2012

EXFO Adds Bonded DSL Testing Capability to the MaxTester Series

EXFO Inc. (NASDAQ: EXFO) (TSX: EXF) announced today the launch of the MaxTester 630, featuring a new-generation Broadcom VDSL2/ADSL2+ chipset. This enhanced DSL multiplay tester enables service providers to save time and reduce repeat faults by letting them test multiple xDSL technologies within a single, dedicated solution. ...

Feb 17, 2012

EXFO Extends OTDR-Based iOLM Technology to Access and LAN/WAN Networks and Data Centers

EXFO Inc. (NASDAQ: EXFO) (TSX: EXF) announced today the integration of its proprietary iOLM technology to the FTB-720 LAN/WAN Access test module. Thanks to the added features, the new FTB-720 iOLM speeds up and simplifies optical fiber assessment within access and LAN/WAN networks, as well as data centers.


Feb 17, 2012

EXFO Brings Unmatched Cloud and Mobile Backhaul Service Reliability with EtherSAM Burst Testing

EXFO Inc. (NASDAQ: EXFO) (TSX: EXF) announced today the addition of burst testing functionalities to its award-winning Ethernet field-testing instruments. As part of its unique, ITU-T-compliant EtherSAM (Y. ...

LDC-5000
Laser Diode Characterization

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Laser Diode Characterization System

The LDC / LBC System Family is a fully configurable, all in one laser diode, LED and laser diode bar characterization system platform for R&D laboratories and industry use.

Designed to measure and analyze all major characteristics of mounted laser diodes, LEDs, Laser diode bars and stacks in a fast and reproducible way it is the ideal tool for data sheet generation, process monitoring, incoming and outgoing quality control, failure analysis and research activities with semiconductor emitters. According to its cost effective and modular setup it can be configured to accommodate various power levels, mounts and housings.

LDC 5000 Laser Diode Characterization System is specifically designed to test and characterize mounted single diode laser and LEDs. It provides a comprehensive set of measurements and can be configured to measure devices from UV-LEDs through telecom laser diodes up to high power emitters. Several available options allow to the system to be customized for additional tests. Designed for Laboratory and R&D and industrial use the systems comes in a Laser Class IV configuration incl. safety interlocks and optical enclosure.

Features:

  • LIV and derived analysis units
  • Beam Profile Analysis
  • Spectral Analysis
  • Near Field Analysis
  • Far Field Analysis
  • Low and high current option
  • CW and Pulsed option

Applications:

  • Telekom LD, high power LD and LED characterization
  • R&D and laboratory use
  • Incoming and outgoing QC- tests
  • Product qualifications tests
  • S/W-controlled fully configurable automated LD-characterization