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Ansprechpartner:
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3E//EVENT

Aktuelle Events

3E//NEWS

Aktuelle Meldungen

03.02.2011

EXFO Launches LAN/WAN Access OTDR for Its FTB-1 Handheld Platform, Combining Modularity, Connectivity and Affordability

Designed for everyday testing in access and LAN/WAN networks, the FTB-720 is the perfect construction OTDR to test singlemode and multimode fibers with a single unit.


02.11.2010

IE-Multiway von IMC Networks jetzt bei 3 EDGE bestellbar.

Der IE-MultiWay ist eine wertorientierte, Carrier-class Ethernet, FTTx Lösung, die ideal für die Verwendung als CPE Gerät an dem Netzwerkübergabepunkt des Kundens als auch in der Lichtwellenleiter Infrastruktur ist. ...

23.03.2010

Accedian Introduces 10GbE Packet Performance Node

The MetroNODE 10GE™ maintains thousands of Y.1731 sessions at the Mobile Switching Center (MSC) for complete OAM, performance monitoring and fault management for 3G & 4G (LTE/WiMAX) backhaul networks.


LDC-5000
Laser Diode Characterization

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Laser Diode Characterization System

The LDC / LBC System Family is a fully configurable, all in one laser diode, LED and laser diode bar characterization system platform for R&D laboratories and industry use.

Designed to measure and analyze all major characteristics of mounted laser diodes, LEDs, Laser diode bars and stacks in a fast and reproducible way it is the ideal tool for data sheet generation, process monitoring, incoming and outgoing quality control, failure analysis and research activities with semiconductor emitters. According to its cost effective and modular setup it can be configured to accommodate various power levels, mounts and housings.

LDC 5000 Laser Diode Characterization System is specifically designed to test and characterize mounted single diode laser and LEDs. It provides a comprehensive set of measurements and can be configured to measure devices from UV-LEDs through telecom laser diodes up to high power emitters. Several available options allow to the system to be customized for additional tests. Designed for Laboratory and R&D and industrial use the systems comes in a Laser Class IV configuration incl. safety interlocks and optical enclosure.

Features:

  • LIV and derived analysis units
  • Beam Profile Analysis
  • Spectral Analysis
  • Near Field Analysis
  • Far Field Analysis
  • Low and high current option
  • CW and Pulsed option

Applications:

  • Telekom LD, high power LD and LED characterization
  • R&D and laboratory use
  • Incoming and outgoing QC- tests
  • Product qualifications tests
  • S/W-controlled fully configurable automated LD-characterization