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Ansprechpartner:
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3E//EVENT

Aktuelle Events

3E//NEWS

Aktuelle Meldungen

03.02.2011

EXFO Launches LAN/WAN Access OTDR for Its FTB-1 Handheld Platform, Combining Modularity, Connectivity and Affordability

Designed for everyday testing in access and LAN/WAN networks, the FTB-720 is the perfect construction OTDR to test singlemode and multimode fibers with a single unit.


02.11.2010

IE-Multiway von IMC Networks jetzt bei 3 EDGE bestellbar.

Der IE-MultiWay ist eine wertorientierte, Carrier-class Ethernet, FTTx Lösung, die ideal für die Verwendung als CPE Gerät an dem Netzwerkübergabepunkt des Kundens als auch in der Lichtwellenleiter Infrastruktur ist. ...

23.03.2010

Accedian Introduces 10GbE Packet Performance Node

The MetroNODE 10GE™ maintains thousands of Y.1731 sessions at the Mobile Switching Center (MSC) for complete OAM, performance monitoring and fault management for 3G & 4G (LTE/WiMAX) backhaul networks.


LBC-8000
Laser Diode Bar Characterization

LDC 8000 – Laser Diode Characterization System

The LDC / LBC System Family is a fully configurable, all in one laser diode, LED and laser diode bar characterization system platform for R&D laboratories and industry use.

Designed to measure and analyze all major characteristics of mounted laser diodes, LEDs, Laser diode bars and stacks in a fast and reproducible way it is the ideal tool for data sheet generation, process monitoring, incoming and outgoing quality control, failure analysis and research activities with semiconductor emitters. According to its cost effective and modular setup it can be configured to accommodate various power levels, mounts and housings.

The LBC 8000 Laser Diode Bar Characterization System is specifically designed to test and characterize mounted High power Laser Diode Bars and Laser Diode Bar Stacks. It provides a comprehensive set of measurements and can be configured to characterize mounted Laser Bars with up to 125A (CW) and 220A (QCW). Several available options allow to the system to be customized for additional tests. Designed for Laboratory and R&D and industrial use the systems comes in a Laser Class IV configuration incl. safety interlocks and optical enclosure

Features

  • Table top unit
  • LIV and derived analysis
  • Beam profile analysis
  • Spectral analysis
  • Far Field analysis
  • Near Field analysis
  • "Smile" measurement
  • Low and high current option
  • CW and pulsed option 

Applications

  • Characterization of mounted
    - high power laser diode bars and stacks
    - Fiber coupled laser diode modules
  • R&D and QC- tests
  • Incoming and outgoing QC- tests
  • Product qualifications tests
  • S/W-controlled fully configurable automated LD-Bar characterization 

Fixtures

  • CS Mount
  • Chip on Carrier mount
  • Micro channel mount
  • Micro channel stack mount
  • Fiber coupled module mount
  • Customized mount